A 240-channel thick film multi-chip module for readout of silicon drift detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 439, Issue 2-3, 2000, Pages 418-426

  Lynn, D ^a   Bellwied, R ^b   Beuttenmueller, R ^a   Caines, H ^c   Chen, W ^a   DiMassimo, D ^a   Dyke, H ^c   Elliott, D ^a   Grau, M ^a   Hoffmann, G W ^d   Humanic, T ^c   Jensen, P ^d   Kleinfelder, S A ^e   Kotov, I ^c   Kraner, H W ^a   Kuczewski, P ^a   Leonhardt, B ^a   Li, Z ^a   Liaw, C J ^a   LoCurto, G ^c   Middelkamp, P ^a   Minor, R ^b   Mazeh, N ^b   Nehmeh, S ^b   O'Conner, P ^a   Ott, G ^d   Pandey, S U ^b   Pruneau, C ^b   Pinelli, D ^a   Radeka, V ^a   Rescia, S ^a   Rykov, V ^b   Schambach, J ^d   Sedlmeir, J ^a   Sheen, J ^b   Soja, B ^a   Stephani, D ^a   Sugarbaker, E ^c   Takahashi, J ^f   Wilson, K ^b   more..

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b WAYNE STATE UNIVERSITY   (United States)

^c OHIO STATE UNIVERSITY   (United States)

^d UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^e LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^f UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CAPACITORS; CMOS INTEGRATED CIRCUITS; MULTICHIP MODULES; READOUT SYSTEMS; SEMICONDUCTING SILICON; THICK FILM DEVICES;

SWITCHED CAPACITOR ARRAYS (SCA);

DRIFT CHAMBERS;

EID: 0033908739     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00934-1     Document Type: Article

References (4)

1. S.A. Kleinfelder, IEEE Trans. Nucl. Sci. NS-37 (1990) 1230.
2. J.W. Harris, the STAR Collaboration, Nucl. Phys. A 566 (1994) 277c.
3. S. Rescia, Brookhaven National Lab, to be published.
4. J. Takahashi et al., Nucl. Instr. and Meth. A 439 (2000) 497.