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Volumn 35, Issue 1, 2000, Pages 119-124

Low-power embedded SRAM with the current-mode write technique

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC LOSSES; ELECTRIC POTENTIAL; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT LAYOUT;

EID: 0033908207     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.818929     Document Type: Article
Times cited : (16)

References (7)
  • 1
    • 0029288557 scopus 로고
    • Trends in low-power RAM circuit technologies
    • Apr.
    • K. Itoh, K. Sasaki, and Y. Nakagome, "Trends in low-power RAM circuit technologies," Proc. IEEE, vol. 83, pp. 524-543, Apr. 1995.
    • (1995) Proc. IEEE , vol.83 , pp. 524-543
    • Itoh, K.1    Sasaki, K.2    Nakagome, Y.3
  • 2
    • 0026141225 scopus 로고
    • Current-mode techniques for high-speed VLSI circuits with application to current sense amplifier for CMOS SRAM's
    • Apr.
    • E. Seevinck, P. J. van Beers, and H. Ontrop, "Current-mode techniques for high-speed VLSI circuits with application to current sense amplifier for CMOS SRAM's" IEEE J. Solid-State Circuits, vol. 26, pp. 525-536, Apr. 1991.
    • (1991) IEEE J. Solid-state Circuits , vol.26 , pp. 525-536
    • Seevinck, E.1    Van Beers, P.J.2    Ontrop, H.3
  • 3
    • 0026142035 scopus 로고
    • A high-speed clamped bit-line current-mode sense amplifier
    • Apr.
    • T. N. Blalock and R. C. Jaeger, "A high-speed clamped bit-line current-mode sense amplifier," IEEE J. Solid-State Circuits, vol. 26, pp. 542-548, Apr. 1991.
    • (1991) IEEE J. Solid-state Circuits , vol.26 , pp. 542-548
    • Blalock, T.N.1    Jaeger, R.C.2
  • 4
    • 0026852658 scopus 로고
    • High-speed hybrid current-mode sense amplifier for CMOS SRAM's
    • Apr.
    • P. Y. Chee, P. C. Liu, and L. Siek, "High-speed hybrid current-mode sense amplifier for CMOS SRAM's," Electron. Lett., vol. 28, no. 9, pp. 871-873, Apr. 1992.
    • (1992) Electron. Lett. , vol.28 , Issue.9 , pp. 871-873
    • Chee, P.Y.1    Liu, P.C.2    Siek, L.3
  • 5
    • 0023437909 scopus 로고
    • Static-noise margin analysis of MOS SRAM cells
    • Oct.
    • E. Seevinck, F. J. List, and J. Lohstroh, "Static-noise margin analysis of MOS SRAM cells," IEEE J. Solid-State Circuits, vol. SC-22, pp. 748-754, Oct. 1987.
    • (1987) IEEE J. Solid-state Circuits , vol.SC-22 , pp. 748-754
    • Seevinck, E.1    List, F.J.2    Lohstroh, J.3
  • 7
    • 0013208928 scopus 로고    scopus 로고
    • Taiwan Semiconductor Manufacture Corp.
    • "0.6-μm CMOS ASIC process digests," Taiwan Semiconductor Manufacture Corp., 1996.
    • (1996) 0.6-μm CMOS ASIC Process Digests


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.