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Volumn 19, Issue 2, 2000, Pages 143-145
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Precipitates and phase transformation in Ti-Ni-Cu shape memory alloy thin film
a a a a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELECTRIC RESISTANCE MEASUREMENT;
EXTRAPOLATION;
PHASE TRANSITIONS;
PRECIPITATION (CHEMICAL);
SHAPE MEMORY EFFECT;
THERMAL EFFECTS;
THIN FILMS;
TITANIUM ALLOYS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
TANGENTIAL EXTRAPOLATION METHOD;
METALLIC FILMS;
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EID: 0033907864
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1006659717010 Document Type: Article |
Times cited : (7)
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References (11)
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