Measurement of submicron laser beam profiles using nanoprobes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4016, Issue , 2000, Pages 309-314

  Jakl, Petr ^a   Jonas, Alexandr ^a   Lazar, Josef ^a   Cip, Ondrej ^a   Harna, Zdenek ^a   Liska, Miroslav ^a   Tomanek, Pavel ^a   Zemanek, Pavel ^a  

^a INSTITUTE OF MATHEMATICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LASER MODES; OPTICAL MICROSCOPY;

INTENSITY PROFILE MEASUREMENTS; NANOPROBES;

LASER BEAMS;

EID: 0033907845     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)