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Volumn 8, Issue 4, 2000, Pages 391-397
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Characterization of stacking faults on basal planes in intermetallic compounds La5Ni19 and La2Ni7
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
DESORPTION;
ELECTRON DIFFRACTION;
GAS ABSORPTION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
HYDROGEN;
INTERMETALLICS;
ISOTHERMS;
STACKING FAULTS;
LANTHANUM NICKEL ALLOYS;
LANTHANUM ALLOYS;
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EID: 0033907491
PISSN: 09669795
EISSN: None
Source Type: Journal
DOI: 10.1016/S0966-9795(99)00121-1 Document Type: Article |
Times cited : (36)
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References (16)
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