메뉴 건너뛰기




Volumn 8, Issue 4, 2000, Pages 391-397

Characterization of stacking faults on basal planes in intermetallic compounds La5Ni19 and La2Ni7

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; DESORPTION; ELECTRON DIFFRACTION; GAS ABSORPTION; HIGH RESOLUTION ELECTRON MICROSCOPY; HYDROGEN; INTERMETALLICS; ISOTHERMS; STACKING FAULTS;

EID: 0033907491     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(99)00121-1     Document Type: Article
Times cited : (36)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.