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Volumn 442, Issue 1, 2000, Pages 417-422
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Quality control of GEM detectors using scintillation techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE COUPLED DEVICES;
IMAGE ANALYSIS;
LIGHT EMISSION;
METAL FOIL;
MICROSTRUCTURE;
SCINTILLATION;
GAS ELECTRON MULTIPLIER DETECTOR;
LUMINOCITY COLLIDERS;
OPTICAL IMAGE;
GAS DETECTORS;
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EID: 0033906709
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)01266-8 Document Type: Article |
Times cited : (17)
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References (4)
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