메뉴 건너뛰기




Volumn 442, Issue 1, 2000, Pages 417-422

Quality control of GEM detectors using scintillation techniques

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; IMAGE ANALYSIS; LIGHT EMISSION; METAL FOIL; MICROSTRUCTURE; SCINTILLATION;

EID: 0033906709     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01266-8     Document Type: Article
Times cited : (17)

References (4)
  • 2
    • 85031608049 scopus 로고    scopus 로고
    • private communication
    • F. Sauli, private communication.
    • Sauli, F.1
  • 4
    • 85031602954 scopus 로고    scopus 로고
    • S. Bachmann, A. Bressan, L. Ropelewski, F. Sauli, A. Sharma, D. Mormann, CERN-EP/99-48
    • S. Bachmann, A. Bressan, L. Ropelewski, F. Sauli, A. Sharma, D. Mormann, CERN-EP/99-48.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.