Deciduous teeth occlusal caries detection with 655 nm diode laser confirmed by surface scanning electron microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3910, Issue , 2000, Pages 297-305

  Duarte, Danilo ^a   Fonseca, Yara Piarengeli Claudio ^a   Zanin, Fatima ^a   Junior, Aldo Brugnera ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DENTISTRY; LASER TISSUE INTERACTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR LASERS; SURFACE ROUGHNESS;

OCCLUSAL CARIES;

LASER APPLICATIONS;

EID: 0033906550     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.380841     Document Type: Conference Paper

References (12)