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Volumn 439, Issue 1, 2000, Pages 167-177
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New technique for thick source alpha counting determination of U and Th
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Author keywords
Alpha counting; U, Th, Thick source
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Indexed keywords
ALPHA PARTICLES;
SEMICONDUCTING SILICON;
SEMICONDUCTOR COUNTERS;
THORIUM;
URANIUM;
SILICON DETECTORS;
RADIATION COUNTERS;
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EID: 0033905801
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00818-9 Document Type: Article |
Times cited : (11)
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References (16)
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