Laser-induced damage threshold and laser processing of GaN

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3885, Issue , 2000, Pages 311-322

  Sun, Hong Bo ^a   Juodkazis, Saulius ^a   Eliseev, P G ^a   Sugahara, T ^a   Wang, Tao ^a   Matsuo, Shigeki ^a   Sakai, Shiro ^a   Misawa, Hiroaki ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LASER ABLATION; LASER DAMAGE; LASER PULSES; OPTICAL INSTRUMENT LENSES;

GALLIUM NITRIDE; LASER INDUCED DAMAGING THRESHOLDS (LIDT);

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0033905467     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.376976     Document Type: Conference Paper

References (12)