Characterization of Dirac-structure edges with wavelet transform

IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics

Volumn 30, Issue 1, 2000, Pages 93-109

  Tang, Yuan Y ^a,b   Yang, Lihua ^c   Liu, Jiming ^a,b  

^a IEEE   (Hong Kong)

^b HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

^c SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIRAC-STRUCTURE EDGE; GREY-LEVEL INVARIANTS; SPLINE-WAVELET TRANSFORMS;

IMAGE ANALYSIS; IMAGE QUALITY; WAVELET TRANSFORMS;

EDGE DETECTION;

EID: 0033905230     PISSN: 10834419     EISSN: None     Source Type: Journal    
DOI: 10.1109/3477.826950     Document Type: Article

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