Design of cantilever probes for Atomic Force Microscopy (AFM)

Engineering Optimization

Volumn 32, Issue 3, 2000, Pages 373-392

  Pedersen, Niels L ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EIGENVALUES AND EIGENFUNCTIONS; FINITE ELEMENT METHOD; LINEAR PROGRAMMING; MATHEMATICAL MODELS; MICROELECTROMECHANICAL DEVICES; OPTIMIZATION; STIFFNESS; SYSTEMS ANALYSIS;

CANTILEVER PROBES; METHOD OF MOVING ASYMPTOTES; SEQUENTIAL LINEAR PROGRAMMING;

PROBES;

EID: 0033904999     PISSN: 0305215X     EISSN: None     Source Type: Journal    
DOI: 10.1080/03052150008941305     Document Type: Article

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