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Volumn 280, Issue 1, 2000, Pages 134-138
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Dynamic recrystallization in Al single crystals revealed by rapid X-ray Laue method
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Author keywords
Dynamic recrystallization; Grains; Rapid X ray Laue method
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Indexed keywords
COMPRESSION TESTING;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CRYSTALLIZATION;
DEFORMATION;
INGOTS;
SINGLE CRYSTALS;
STRAIN RATE;
STRESS ANALYSIS;
DYNAMIC RECRYSTALLIZATION;
RAPID X-RAY LAUE METHOD;
ALUMINUM;
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EID: 0033904542
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5093(99)00679-6 Document Type: Article |
Times cited : (9)
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References (7)
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