High resolution TOF diffractometer and spectrometer

Physica B: Condensed Matter

Volumn 276-278, Issue , 2000, Pages 116-117

  Demmel, F ^a   Bernhardt, Ph ^a   Magerl, A ^a   Steichele, E ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DIFFRACTOMETERS; NEUTRON DIFFRACTION APPARATUS; NEUTRON SCATTERING; NEUTRON SOURCES; NEUTRON SPECTROMETERS; NUCLEAR REACTORS; PARTICLE DETECTORS; SILICON SENSORS;

NEUTRON DIFFRACTOMETERS;

NUCLEAR INSTRUMENTATION;

EID: 0033904394     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01266-1     Document Type: Article

References (5)

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3. Frick B. Physica B. 234-236:1997;1177.
4. W. Gaubatz, J. Felber, 2. Arbeitstreffen zur Instrumentierung, TUM, 1998.
5. Buras B. Nukleonika. 8:1963;259.