Need of sub-nanosecond resolution to reveal new features during laser induced solidification

Applied Surface Science

Volumn 154, Issue , 2000, Pages 130-134

  Siegel, J ^a   Solis, J ^a   Afonso, C N ^a  

^a INSTITUTO DE ÓPTICA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; LIGHT MEASUREMENT; LIGHT REFLECTION; METAL MELTING; METALLIC FILMS; PULSED LASER APPLICATIONS; SOLIDIFICATION; STREAK CAMERAS; THIN FILMS;

LASER-INDUCED SOLIDIFICATION; PULSED LASER MELTING; RECALESCENCE;

AMORPHOUS FILMS;

EID: 0033903841     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00420-1     Document Type: Article

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