Space technology from X-ray telescopes for focusing SANS and reflectometry

Physica B: Condensed Matter

Volumn 276-278, Issue , 2000, Pages 52-54

  Alefeld, B ^a   Dohmen, L ^a   Richter, D ^a   Brückel, Th ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; NEUTRON REFLECTION; NEUTRON SCATTERING; X RAY APPARATUS;

SMALL-ANGLE NEUTRON SCATTERING (SANS);

TELESCOPES;

EID: 0033902218     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01323-X     Document Type: Article

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