Modelling the capacitance of d.c. etched aluminum electrolytic capacitor foil

Journal of Applied Electrochemistry

Volumn 30, Issue 3, 2000, Pages 285-291

  Goad, D G W ^a   Uchi, H ^b  

^a Boundary Technologies Inc   (United States)

^b KDK Corp   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM FOIL; ANODES; ANODIC OXIDATION; CAPACITANCE; DIELECTRIC FILMS; ETCHING; MATHEMATICAL MODELS;

ELECTROCHEMICAL ETCHING;

ELECTROLYTIC CAPACITORS;

EID: 0033902167     PISSN: 0021891X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1003527316173     Document Type: Article

References (15)

1. A.R. Morley and D.S. Campbell, Radio Electron. Eng. 43 (1973) 421.
2. C.K. Dyer and R.S. Alwitt, J. Electrochem. Soc. 128 (1981) 300.
3. H. Uchi, R. Yonemori, H. Sugiyama and A. Yamada, Japan J. Technol. Educ. 2 (1993) 33.
4. D. Goad, J. Electrochem. Soc. 144 (1997) 1965.
5. B.J. Wiersma and K.R. Hebert, J. Electrochem. Soc. 138 (1991) 48.
6. R.S. Alwitt, H. Uchi, T.R. Beck and R.C. Alkire, J. Electrochem. Soc. 131 (1984) 13.
7. A. Kioke, H. Fujiwara and M. Manabu, Japanese patent 2 303 018 (1990).
8. KDK Corporation, Tokyo, Japan, Catalog EF-153, section 11, test methods (1996).
9. C.G. Dunn, R.B. Bolon, A.S. Alwan and A.W. Stirling, J. Electrochem. Soc. 118 (1971) 381.
10. L.A. Kostelova, R.A. Mirziev, I.T. Rosin and E.V. Kharitonov, Elektrokhimiya 15 (1979) 648.
11. K. Shimizu, G.M. Brown, K. Kobayashi, P. Skeldon, G.E. Thompson and G.C. Wood, ATB Metallurgie 27 (1997) 188.
12. N. Reid and J.E. Beesley, 'Sectioning and Cryosectioning for Electron Microscopy', (Elsevier, Oxford, 1991).
13. D. Halliday and R. Resnick, 'Physics', 2nd edn, (J. Wiley & Sons, New York, 1966), chapter 30.
14. C.K. Dyer and R.S. Alwitt, Electrochim. Acta 23 (1978) 347.
15. G.E.P. Box, W.G. Hunter and J.S. Hunter, 'Statistics for Experimenters' (J. Wiley & Sons, New York, 1978).