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Volumn 2, Issue , 2000, Pages 1115-1121

Analysis by measurements and circuit simulations of the PT- and NPT-IGBT under different short-circuit conditions

Author keywords

[No Author keywords available]

Indexed keywords

NON-PUNCH THROUGH INTEGRATED GATE BIPOLAR TRANSISTORS (NPT-IGBT); PUNCH THROUGH INTEGRATED GATE BIPOLAR TRANSISTORS (PT-IGBT); SOFTWARE PACKAGE SPICE;

EID: 0033901058     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 1
    • 25344475465 scopus 로고
    • Dynamic IGBT short-circuit tests for evaluation and production
    • H.Giepibl: "Dynamic IGBT Short-circuit Tests for Evaluation and Production", PCIM'94, Numberg, Proc. Power Conversion, 1994, pp. 413-418.
    • (1994) PCIM'94, Numberg, Proc. Power Conversion , pp. 413-418
    • Giepibl, H.1
  • 2
    • 84884210050 scopus 로고    scopus 로고
    • Behavior of fast and ultrafast 600V punch-through IGBT under unclamped inductive switching
    • S. Azzopardi, J.M. Vinassa, C. Zardini: "Behavior of Fast and Ultrafast 600V Punch-Through IGBT under Unclamped Inductive Switching", EPE'99, Conf. Proc., 1999.
    • (1999) EPE'99, Conf. Proc.
    • Azzopardi, S.1    Vinassa, J.M.2    Zardini, C.3
  • 3
    • 0343314350 scopus 로고
    • Short circuit behavior for PT and NPT IGBT devices - Protection against explosion of the case by fuses
    • S Duong, S Rael, C. Schaeffer. J.F. de Palma: "Short Circuit Behavior for PT and NPT IGBT Devices - Protection Against Explosion of the Case by Fuses", EPE'95 Conf. Proc., 1995, pp. 1-249-1-254
    • (1995) EPE'95 Conf. Proc. , pp. 1249-1254
    • Duong, S.1    Rael, S.2    Schaeffer, C.3    De Palma, J.F.4
  • 4
    • 0342879375 scopus 로고
    • The short circuit behavior of IGBTs based on different technologies
    • R. Kraus, M. Reddig, K. Hoffmann: "The Short Circuit Behavior of IGBTs based on Different Technologies", EPE'95 Conf. Proc., 1995, pp. 1-157- 1-160.
    • (1995) EPE'95 Conf. Proc. , pp. 1157-1160
    • Kraus, R.1    Reddig, M.2    Hoffmann, K.3
  • 5
    • 0342879373 scopus 로고
    • Short circuit ruggedness, switching, and stationary behaviour of new high voltage IGBT in measurement and simulations
    • Y. C. Gerstenmaier, G. J. E. Scheller, M. Hierolzer: "Short Circuit Ruggedness, Switching, and Stationary Behaviour of New High Voltage IGBT in Measurement and Simulations", EPE'95 Conf. Proc., 1995, pp. 1-161 - 1-165.
    • (1995) EPE'95 Conf. Proc. , pp. 1161-1165
    • Gerstenmaier, Y.C.1    Scheller, G.J.E.2    Hierolzer, M.3
  • 6
    • 72949095743 scopus 로고
    • Optimization of the short circuit behaviour of NPT-IGBT by the gate drive
    • H.-G. Eckel, L. Sack: "Optimization of the Short Circuit Behaviour of NPT-IGBT by the Gate Drive", EPE'95 Conf. Proc., 1995, pp. 2-213-2-218.
    • (1995) EPE'95 Conf. Proc. , pp. 2213-2218
    • Eckel, H.-G.1    Sack, L.2
  • 7
    • 0342879371 scopus 로고
    • A new generation of IGBTs and concepts for their protection, PCIM'94, numberg
    • K. Reinmuth, L. Lorenz: "A New Generation of IGBTs and Concepts for Their Protection, PCIM'94, Numberg, Proc. Power Conversion, 1994, pp. 139-147.
    • (1994) Proc. Power Conversion , pp. 139-147
    • Reinmuth, K.1    Lorenz, L.2
  • 9
    • 0026868079 scopus 로고
    • A 2000V non-punch-through IGBT with high ruggedness
    • T. Laska, G. Miller, J. Niedermeyr: "A 2000V Non-Punch-Through IGBT with High Ruggedness", Solid-state Electronics, Vol. 35, No. 5, 1992, pp. 681-685.
    • (1992) Solid-state Electronics , vol.35 , Issue.5 , pp. 681-685
    • Laska, T.1    Miller, G.2    Niedermeyr, J.3
  • 10
    • 0026136708 scopus 로고
    • An investigation of the drive circuit requirements for the power insulated gate bipolar transistor (IGBT)
    • April
    • A.R.Hefner, Jr.: "An Investigation of the Drive Circuit Requirements for the Power Insulated Gate Bipolar Transistor (IGBT)", IEEE Transactions on PE, Vol. 6, No. 2, April 1991, pp. 208-219.
    • (1991) IEEE Transactions on PE , vol.6 , Issue.2 , pp. 208-219
    • Hefner Jr., A.R.1
  • 11
    • 0029267581 scopus 로고
    • Modeling buffer layer IGBTs for circuit simulation
    • March
    • A.R.Hefner, Jr.: "Modeling Buffer Layer IGBTs for Circuit Simulation", IEEE Transactions on PE, Vol. 10, No. 2, March 1995, pp. 111-123.
    • (1995) IEEE Transactions on PE , vol.10 , Issue.2 , pp. 111-123
    • Hefner Jr., A.R.1
  • 12
    • 84884206493 scopus 로고
    • Analysis and modeling of the technology dependent electro-thermal IGBT characteristics
    • R. Kraus, K. Hoffmann, P. Turkes: "Analysis and Modeling of the Technology Dependent Electro-thermal IGBT Characteristics", IPEC'95 Conference Proc., 1995.
    • (1995) IPEC'95 Conference Proc.
    • Kraus, R.1    Hoffmann, K.2    Turkes, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.