Packaging and characterization of high power diode lasers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3945, Issue , 2000, Pages 270-277

  Jandeleit, Juergen ^a   Wiedmann, Nicolas ^a   Ostlender, Andreas ^a   Brandenburg, Wolfgang ^a   Loosen, Peter ^a   Poprawe, Reinhart ^a  

^a FRAUNHOFER INSTITUTE FOR LASER TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; LASER DIAGNOSTICS; RELIABILITY;

DIVERGENCE ANGLE;

SEMICONDUCTOR LASERS;

EID: 0033900725     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.380544     Document Type: Conference Paper

References (7)