Pulsed top-hat beam thermal lens: A simple and sensitive tool for in situ measurement on ultraviolet dielectric components

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3902, Issue , 2000, Pages 470-478

  Li, B C ^a   Martin, S ^a   Welsch, E ^a   Thielsch, R ^a   Heber, J ^a   Kaiser, N ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; EXCIMER LASERS; LASER DAMAGE; LASER PULSES; LIGHT ABSORPTION; LIGHT REFLECTION; MELTING; NONLINEAR OPTICS; OPTICAL COATINGS; THERMAL STRESS; THERMOELASTICITY; ULTRAVIOLET RADIATION;

LASER INDUCED DAMAGE THRESHOLD (LIDT); NONLINEAR ABSORPTION; PULSED TOP-HAT BEAM THERMAL LENSES; ULTRAVIOLET DIELECTRIC COATINGS;

OPTICAL INSTRUMENT LENSES;

EID: 0033900596     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.379313     Document Type: Conference Paper

References (14)