Computer-aided analysis of TEM images of CdSe/ZnSe quantum dots

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 69, Issue , 2000, Pages 361-366

  Kirmse, H ^a,b   Neumann, W ^a   Wiebach, T ^a   Kohler R ^a   Scheerschmidt, K ^a   Conrad, D ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; FINITE ELEMENT METHOD; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY;

LATTICE MISMATCH;

NANOSTRUCTURED MATERIALS;

EID: 0033899646     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00294-9     Document Type: Article

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