Effects of thickness on the residual stress behavior of high temperature polyimide films

Polymer Journal

Volumn 32, Issue 3, 2000, Pages 215-221

  Chung, Hyunsoo ^a   Joe, Yung Il ^a   Han, Haksoo ^a  

^a Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CURING; HIGH TEMPERATURE PROPERTIES; MORPHOLOGY; POLYIMIDES; RESIDUAL STRESSES; STRESS ANALYSIS; X RAY DIFFRACTION ANALYSIS;

MOLECULAR ANISOTROPY;

PLASTIC FILMS;

EID: 0033898974     PISSN: 00323896     EISSN: None     Source Type: Journal    
DOI: 10.1295/polymj.32.215     Document Type: Article

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