Nonlinear electromechanical interfacial fracture for piezoelectric materials

Mechanics of Materials

Volumn 32, Issue 1, 2000, Pages 57-64

  Shen, Shengping ^a   Nishioka, Toshihisa ^a   Kuang, Zhen Bang ^b   Liu, Zhengxing ^b  

^a KOBE UNIVERSITY OF MERCANTILE MARINE   (Japan)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; ELECTRICITY; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PIEZOELECTRIC MATERIALS; SATURATION (MATERIALS COMPOSITION); SHEAR STRESS; YIELD STRESS;

CRACK OPENING DISPLACEMENT; DUGDALE MODEL; ELECTRIC SATURATION; INTERFACIAL FRACTURE;

FRACTURE MECHANICS;

EID: 0033895775     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-6636(99)00036-8     Document Type: Article

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