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Volumn 446, Issue 3, 2000, Pages 294-300
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Oscillating low-energy electron diffraction for studying nanostructured surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
CORRELATION METHODS;
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL DEFECTS;
INSULATING MATERIALS;
LOW ENERGY ELECTRON DIFFRACTION;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
SIGNAL TO NOISE RATIO;
SURFACE ROUGHNESS;
SURFACE DEFECTS;
MICA;
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EID: 0033895048
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)01158-9 Document Type: Article |
Times cited : (11)
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References (15)
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