SCOPUS 정보 검색 플랫폼

Journal of Magnetism and Magnetic Materials

Volumn 213, Issue 1, 2000, Pages 234-244

Correlation of magnetic and microstructural properties of obliquely deposited Co/Cr thin films

(7) Jackson, M a Mendus, T b Short, G R b Thompson, S M b Whiting, J S S b Ho, E M c Petford Long, A c

a BANGOR UNIVERSITY (United Kingdom)

b UNIVERSITY OF YORK (United Kingdom)

c UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; COBALT; CORRELATION METHODS; ELECTRON BEAMS; EVAPORATION; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETIC ANISOTROPY; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; VACUUM APPLICATIONS;

ELECTRON BEAM EVAPORATION; INTERLAYER COUPLING STRENGTH; METAL EVAPORATED TAPE; OBLIQUE DEPOSITION; SPIN WAVES; ULTRAHIGH VACUUM;

MAGNETIC THIN FILMS;

EID: 0033894757 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(99)00572-7 Document Type: Article

Times cited : (7)

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