Crystal structure determination of Y2SiAIO5N "B-Phase" by rietveld analysis

Materials Science Forum

Volumn 325-326, Issue , 2000, Pages 325-334

  Gonon, M F ^a   Descamps, J C ^b   Gambier, F ^a   Thompson, O P ^b  

^a FACULTÉ POLYTECHNIQUE DE MONS   (Belgium)

^b Belgian Ceramic Research Centre   (Belgium)

Author keywords

B phase; Crystal structure; Rietveld x ray analysis; Y siaion

Indexed keywords

CRYSTAL STRUCTURE; SILICON NITRIDE; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION; YTTRIUM COMPOUNDS;

RIETVELD ANALYSIS; YTTRIUM SILICON ALUMINUM OXYNITRIDE;

CERAMIC MATERIALS;

EID: 0033894504     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

References (6)

1. D.P.Thompson, The crystal chemistry of nitrogen ceramics, Materials Science Forum, 47 (1989) p. 21-42
2. KLiddell, H.Mandal & D.P.Thompson, "X-ray data for new Y-Si-Al-O-N glass ceramic", Paper accepted for publication in J. Eur. Ceram. Soc. (1997)
3. K.Liddell & D.P.Thompson, Heat treatment of wollastonite-type Y-Si-Al-O-N glasses
4. D.P.Thompson, New grain-bondary phases for nitrogen ceramics, Mat. Res. Soc Symp. Proc. Symposium K, Vol. 287, ed. I.-W Chen et al. MRS, (1993), p.79-92
5. "Optimisation of nucleation and crystallisation in oxynitride glasses to develop novel glassceramics for advanced thermomechanical and optical applications" Final report Contract N° BRE2-CT92-0272, CEE, Brussels, January 1996
6. Internationnal tables for X-ray cristallography, The Kynoch Press, Birminghan, England 1 (1969) p. 353-5