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Volumn 4, Issue SUPPL. 1, 1999, Pages 55-59
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ICTS measurements of single grain boundaries in ZnO:rare-earth varistor
a a |
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Author keywords
[No Author keywords available]
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Indexed keywords
CERAMIC PRODUCTS;
CURRENT VOLTAGE CHARACTERISTICS;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
MICROELECTRODES;
PHOTOLITHOGRAPHY;
RARE EARTH COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
VARISTORS;
INTERFACE STATE DENSITY;
ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY (ICTS);
ZINC OXIDE;
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EID: 0033894435
PISSN: 13853449
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1009973704222 Document Type: Article |
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Times cited : (17)
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References (19)
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