Surface geometric structure of chemically modified silica studied by direct atomic force microscopy (AFM) imaging and adsorption method

Langmuir

Volumn 16, Issue 7, 2000, Pages 3281-3287

  Fuji, Masayoshi ^a   Machida, Kotoe ^a   Takei, Takashi ^a   Watanabe, Tohru ^a   Chikazawa, Masatoshi ^a  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ALCOHOLS; ATOMIC FORCE MICROSCOPY; AUTOCLAVES; CHEMICAL MODIFICATION; HYDROPHOBICITY; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; SURFACE STRUCTURE; SURFACE TREATMENT; WETTING;

DODECANOL; PREFERENTIAL DISPERSION TESTS;

SILICA;

EID: 0033893864     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la991134x     Document Type: Article

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