SIMS and XPS characterization of CdS/CdTe heterostructures grown by MBE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 975-979

  Boieriu, P ^a   Sporken, R ^a,b   Adriaens, A ^c   Xin, Yan ^a   Browning, N D ^a   Sivananthan, S ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b UNIVERSITY OF NAMUR   (Belgium)

^c UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM; MOLECULAR BEAM EPITAXY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DOPING; SILICON; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

EPITAXIAL LAYERS; WURTZITE;

HETEROJUNCTIONS;

EID: 0033893696     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00926-X     Document Type: Article

References (6)

1. Bassani F., Tatarenko S., Saminadayar K., Bleuse J., Magnea N., Pautrat L.L. Appl. Phys. Lett. 58:1991;2651.
2. Arias J.M., Shin S.H., Cooper D.E., Zandian M., Pasko J.G., Gertner E.R., DeWames R.E. J. Vac. Sci. Technol. A. 8:1990;1125.
3. Wilke W.G., Seedorf R., Horn K. J. Vac. Sci. Technol. B. 7:1989;807.
4. Niles D.W., Höchst H. Phys. Rev. B. 41:1990;12710.
5. P. Boieriu, R. Sporken, Y. Xin, N.D. Browning, S. Sivananthan, J. Electron Mat., in press.
6. Scofield J.H. J. Electron Spectrosc. 8:1976;129.