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Volumn 68, Issue 3, 2000, Pages 131-137

Microstructural characterization of electrodeposited Co/Pt multilayers

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; ELECTRODEPOSITION; ELECTROLYSIS; ELECTRON DIFFRACTION; GRAIN GROWTH; MAGNETIC ANISOTROPY; MAGNETOMETERS; METALLOGRAPHIC MICROSTRUCTURE; PLATINUM; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

EID: 0033893340     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00599-1     Document Type: Article
Times cited : (10)

References (17)
  • 14
    • 85031591920 scopus 로고    scopus 로고
    • Romanian Patents Nos. 64013 (1972) C23B5/32 and 64017 (1974) C23B5/36
    • V. Georgescu, V. Tutovan, Romanian Patents Nos. 64013 (1972) C23B5/32 and 64017 (1974) C23B5/36.
    • Georgescu, V.1    Tutovan, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.