Near infrared wavemeter based on an array of polycrystalline Ge on Si photodetectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3953, Issue , 2000, Pages 88-94

  Masini, G ^a   Colace, L ^a   Assanto, G ^a  

^a ROMA TRE UNIVERSITY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; INFRARED DEVICES; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SOLID STATE DEVICES; WAVEMETERS;

POLYCRYSTALLINE GERMANIUM; QUASIMONOCHROMATIC LIGHT BEAMS; SOLID STATE WAVELENGTH METER; SPECTRAL RESPONSE; WAVELENGTH SENSITIVE DETECTOR;

PHOTODETECTORS;

EID: 0033893047     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)