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Volumn 33, Issue 2, 2000, Pages 562-568

PEEK oligomers as physical model compounds for the polymer. 4. Lamellar microstructure and chain dynamics

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC POLYMERS; ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; MOLECULAR DYNAMICS; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; MORPHOLOGY; RELAXATION PROCESSES; X RAY SCATTERING;

EID: 0033892951     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma991116m     Document Type: Article
Times cited : (21)

References (27)
  • 21
    • 0003685715 scopus 로고
    • Parrish, W., Ed.; Philips technical library, Centrex publishing company: Eindhoven, The Netherlands
    • Wilson, A. J. C. In Mathematical theory of X-ray powder diffractometry; Parrish, W., Ed.; Philips technical library, Centrex publishing company: Eindhoven, The Netherlands, 1963.
    • (1963) Mathematical Theory of X-ray Powder Diffractometry
    • Wilson, A.J.C.1
  • 26
    • 0002958958 scopus 로고
    • Young, R. A., Ed.; International Union of Crystallography, Oxford University Press: Oxford, England
    • Hill, R. J. In The Rietveld Method; Young, R. A., Ed.; International Union of Crystallography, Oxford University Press: Oxford, England, 1995; pp 61-101.
    • (1995) The Rietveld Method , pp. 61-101
    • Hill, R.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.