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Journal of Magnetism and Magnetic Materials

Volumn 211, Issue 1, 2000, Pages 97-104

HREM and XRD characterization of epitaxial perovskite manganites

(4) Gorbenko, O Yu a Graboy, I E a Kauf, A R a Zandbergen, H W b

a MOSCOW STATE UNIVERSITY (Russian Federation)

b DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE CONSTANTS; MAGNETORESISTANCE; MANGANESE COMPOUNDS; PEROVSKITE; SINGLE CRYSTALS; SOLID SOLUTIONS; STRAIN; TWINNING; X RAY CRYSTALLOGRAPHY;

COLOSSAL MAGNETORESISTANCE (CMR); LATTICE MISMATCH;

MAGNETIC THIN FILMS;

EID: 0033892083 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(99)00719-2 Document Type: Article

Times cited : (27)

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