Simplified high-electric-field technique for measuring the liquid crystal anchoring strength

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 39, Issue 1 A/B, 2000, Pages

  Yokoyama, Hiroshi ^a   Sun, Ruipeng ^a,b  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CAPACITORS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; EXTRAPOLATION; MOLECULAR ORIENTATION;

ANCHORING ENERGY; ANCHORING STRENGTH; HIGH ELECTRIC FIELD TECHNIQUE (HEFT);

LIQUID CRYSTALS;

EID: 0033891518     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.l45     Document Type: Article

References (5)

1. H. Yokoyama: Handbook of Liquid Crystal Research (Oxford Univ. Press, New York, 1997) Chap. 6.
2. H. Yokoyama: Mol. Cryst. & Liq. Cryst. 165 (1988) 265.
3. H. Yokoyama and H. A. van Sprang: J. Appl. Phys. 57 (1985) 4520.
4. H. Yokoyama, S. Kobayashi and H. Kamei: J. Appl. Phys. 61 (1987) 4501.
5. 0 as an adjustable parameter. Although this technique introduces an additional fitting parameter, it has an advantage to be applicable even to samples with inhomogeneous tilt distribution and/or unpatterned electrodes.