High-resolution CT tests ceramic parts

American Ceramic Society Bulletin

Volumn 79, Issue 1, 2000, Pages 59-61

  Guo, Zhiping ^a   Ye, Quing ^a   Tian, Jiemo ^a   Zhang, Chaozong ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CHARGE COUPLED DEVICES; COMPUTERIZED TOMOGRAPHY; DEGRADATION; IMAGE RECONSTRUCTION; MICROCOMPUTERS; SCANNING; X RAYS;

CERAMIC PARTS;

CERAMIC MATERIALS;

EID: 0033891029     PISSN: 00027812     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (3)

1. C. Z. Zhang, Z. P. Quo, J. Z. Lu, Q. L. Zhao and G. Tao, "A Microfocal X-CT Experimental System for Testing Ceramic Parts" (in Chinese), CT Theory and Applications, [2] 5-9 (1991).
2. C. Z. Zhang, Z. P. Guo, Y. F. Dong, H. P. Zhang and J. M. Tian, "Testing Advanced Structural Ceramics," Am. Ceram. Soc. Bull., 75 [1] 64-66 (1996).
3. C. Z. Zhang, Z. P. Guo, Y. F. Dong and H. P. Zhang, "Fast Reconstruction CT Image Using Geometric Parameter Table" (in Chinese), J. Tsinghua Univ. (Sci. and Technol.), 38 [7] 47-49 (1998)