Effects of surface roughness on results in elastic recoil detection measurements

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 235-239

  Sajavaara, T ^a   Arstila, K ^a   Laakso, A ^b   Keinonen, J ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRON SCATTERING; EVAPORATION; MONTE CARLO METHODS; MULTILAYERS; SILICON WAFERS; SPECTROMETRY; SURFACE ROUGHNESS; TITANIUM;

ELASTIC RECOIL DETECTION ANALYSIS; MULTIPLE SCATTERING; RUTHERFORD BACKSCATTERING SPECTROMETRY;

STAINLESS STEEL;

EID: 0033890446     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00917-9     Document Type: Article

References (8)

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