Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3966, Issue , 2000, Pages 145-153

  Krueger, Sven ^a   Wernicke, Guenther ^a   Osten, Wolfgang ^a   Kayser, Daniel ^a   Demoli, Nazif ^a   Gruber, Hartmut ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE QUALITY; INTERFEROMETRY; LIGHT MODULATION; NONDESTRUCTIVE EXAMINATION; OPTICAL FILTERS; QUALITY CONTROL; REAL TIME SYSTEMS; WAVELET TRANSFORMS;

INTERFEROMETRIC FRINGE PATTERNS; WAVELET FILTERS;

OBJECT RECOGNITION;

EID: 0033890382     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)