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Applied Surface Science

Volumn 156, Issue 1, 2000, Pages 85-96

Initial growth stages of CaF2 on Si(111) investigated by scanning tunneling microscopy

(1) Sumiya, Touru a

a Nanotec Corporation (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FILM GROWTH; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

CALCIUM FLUORIDE; SEMICONDUCTOR INSULATOR INTERFACE;

CALCIUM COMPOUNDS;

EID: 0033889977 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(99)00364-5 Document Type: Article

Times cited : (19)

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