Probe measurements of XeCl excimer laser ablated Al, Cu, Nb, Ta solid samples

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3885, Issue , 2000, Pages 471-480

  Novodvorsky, Oleg A ^a   Khramova, Olga D ^a   Filippova, Elena O ^a   Shevelev, Alexsandr K ^a  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COPPER; EXCIMER LASERS; NIOBIUM; PULSED LASER APPLICATIONS; TANTALUM;

LANGMUIR PROBE; TIME OF FLIGHT (TOF) MEASUREMENT;

LASER ABLATION;

EID: 0033889422     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.376998     Document Type: Conference Paper

References (18)