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Volumn 208, Issue 1, 2000, Pages 303-312
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Dislocation effect on crystal-melt interface: An in situ observation of the melting of silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL GROWTH FROM MELT;
DISLOCATIONS (CRYSTALS);
INTERFACES (MATERIALS);
THERMAL STRESS;
X RAY CRYSTALLOGRAPHY;
CRYSTAL-MELT INTERFACES;
SEMICONDUCTING SILICON;
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EID: 0033889301
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00406-6 Document Type: Article |
Times cited : (11)
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References (10)
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