Simplified scheme for testing complementarity and realizing quantum eraser

Optics Communications

Volumn 173, Issue 1-6, 2000, Pages 265-267

  Zheng, Shi Biao ^a  

^a FUZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; INTERFEROMETERS; LIGHT INTERFERENCE; PHOTODETECTORS; PHOTONS;

COMPLEMENTARITY; QUANTUM ERASER;

QUANTUM OPTICS;

EID: 0033888627     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(99)00600-8     Document Type: Article

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