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Volumn 210, Issue 1, 2000, Pages 54-59

Molecular dynamics analysis on diffusion of point defects

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH FROM MELT; CRYSTAL LATTICES; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; MOLECULAR DYNAMICS; PRESSURE EFFECTS; SILICON WAFERS;

EID: 0033887785     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00646-6     Document Type: Article
Times cited : (8)

References (19)
  • 8
    • 0343828957 scopus 로고
    • Defects and Properties of Semiconductors
    • KTK Scientific
    • Wada K., Inoue N. Defects and Properties of Semiconductors. Defect Engineering. 1985;169 KTK Scientific.
    • (1985) Defect Engineering , pp. 169
    • Wada, K.1    Inoue, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.