Quality control of compacted layers with field and laboratory seismic testing devices

ASTM Special Technical Publication

Volumn , Issue 1384, 2000, Pages 311-324

  Nazarian, Soheil ^a   Yuan, Deren ^a  

^a UNIVERSITY OF TEXAS AT EL PASO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NONDESTRUCTIVE EXAMINATION; POISSON RATIO; QUALITY ASSURANCE; QUALITY CONTROL; SEISMOLOGY;

COMPACTED LAYERS; FIELD TESTING; LABORATORY TESTING; MODULUS;

COMPACTION;

EID: 0033886233     PISSN: 10403094     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1520/stp15292s     Document Type: Article

References (3)

1. Baker, M. R., Crain, K., and Nazarian, S., 1995, "Determination of Pavement Thickness with a New Ultrasonic Device," Research Report 1966-1, Center for Highway Materials Research, The University of Texas at El Paso, El Paso, TX, 53 p.
2. Nazarian, S., Yuan, D., and Baker, M. R., 1995, "Rapid Determination of Pavement Moduli with Spectral-Analysis-of-Surface-Waves Method," Research Report 1243-1, The University of Texas at El Paso, 76 p.
3. th Annual Symposium of International Center for Aggregate Research, Austin, TX.