Measurement of stark broadening and shift of visible N II lines

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 33, Issue 6, 2000, Pages 1169-1184

  Mar, S ^a   Aparicio, J A ^a   De La Rosa, M I ^a   Del Val, J A ^b   Gigosos, M A ^a   Gonzalez V R ^a   Perez C ^a  

^a UNIVERSITY OF VALLADOLID   (Spain)

^b UNIVERSITY OF SALAMANCA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DISCHARGE LAMPS; ELECTRIC FIELD EFFECTS; ELECTRON ENERGY LEVELS; HELIUM; INTERFEROMETRY; MATHEMATICAL MODELS; PLASMA APPLICATIONS; THERMAL EFFECTS;

SHIFT PARAMETERS; STARK BROADENING;

NITROGEN;

EID: 0033885873     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/33/6/304     Document Type: Article

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