Thermoelectric power of EuNi2(Si1-xGex)2

Physica B: Condensed Matter

Volumn 281-282, Issue , 2000, Pages 134-135

  Sakurai, J ^a   Fukuda, S ^a,b   Mitsuda, A ^a   Wada, H ^a   Shiga, M ^a  

^a UNIVERSITY OF TOYAMA   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER MEASUREMENT; ELECTRON ENERGY LEVELS; LOW TEMPERATURE EFFECTS; MAGNETIC SUSCEPTIBILITY; THERMOELECTRICITY;

EUROPIUM NICKEL SILICON GERMANIDE; VALENCE TRANSITION;

EUROPIUM COMPOUNDS;

EID: 0033885758     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00865-0     Document Type: Article

References (6)

1. G. Wortmann, I. Nowik, B. Perscheid, G. Kaindl, I. Feiner, Phys. Rev. B 43 (1991) 5261.
2. H. Wada, A. Nakamura, A. Mitsuda, M. Shiga, T. Tanaka, H. Mitamura, T. Goto, J. Phys.: Condens. Matter 9 (1997) 7913.
3. J.M. Ziman, Electrons and Phonons, Clarendon, Oxford, 1960.
4. H. Wada, T. Sakata, A. Nakamura, A. Mitsuda, M. Shiga, Y. Ikeda, Y. Bardo, J. Phys. Soc. Japan 68 (1999) 950.
5. J. Sakurai, in: G. Oomi, H. Fujii, T. Fujita (Eds.), Transport and Thermal Properties of f-Electron systems, Prenum Press, New York, 1993, p. 165.
6. W. Frantz, F. Steglich, W. Zell, D. Wohlleben, F. Pobell, Phys. Rev. Lett. 45 (1980) 64.