Real-time 3D shape measurement with digital stripe projection by Texas Instruments Micromirror Devices DMDTM

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3958, Issue , 2000, Pages 90-105

  Frankowski, G ^a   Chen, M ^a   Huth, T ^a  

^a GFMesstechnik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; MIRRORS; SURFACE MEASUREMENT;

SHAPE MEASUREMENT;

OBJECT RECOGNITION;

EID: 0033885627     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)