Critical point and vapor pressure measurements at high temperatures by means of a new apparatus with ultralow residence times

Journal of Chemical and Engineering Data

Volumn 45, Issue 2, 2000, Pages 157-160

  VonNiederhausern, David M ^a   Wilson, Grant M ^a   Giles, Neil F ^a  

^a Wiltech Research Co   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENZENE; HIGH TEMPERATURE TESTING; PRESSURE MEASUREMENT; STYRENE; TEMPERATURE MEASUREMENT; TOLUENE; VAPOR PRESSURE;

CRITICAL POINT; ETHYLBENZENE; FLOW METHOD; SQUALENE; VAPOR PRESSURE MEASUREMENT;

FLOW MEASURING INSTRUMENTS;

EID: 0033884935     PISSN: 00219568     EISSN: None     Source Type: Journal    
DOI: 10.1021/je990232h     Document Type: Article

References (8)