Structural changes of ultra-high molecular weight polyethylene exposed to X-ray flux in X-ray photoelectron spectroscopy detected by valence band and electron spin resonance spectroscopy

Applied Surface Science

Volumn 156, Issue 1, 2000, Pages 97-109

  Buncick, M C ^a   Thomas, D E ^a   McKinny, K S ^a   Jahan, M S ^a  

^a University of Memphis   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRON SPIN RESONANCE SPECTROSCOPY; ELECTRONIC STRUCTURE; FREE RADICALS; RADIATION EFFECTS; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

VALENCE BAND; X RAY FLUX;

ULTRAHIGH MOLECULAR WEIGHT POLYETHYLENES;

EID: 0033884126     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00367-0     Document Type: Article

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