Fast initial response for CUSUM Quality-control schemes: Give your CUSUM A head start

Technometrics

Volumn 42, Issue 1, 2000, Pages 102-107

  Lucas, James M ^a,b   Crosier, Ronald B ^c  

^a DUPONT COMPANY   (United States)

^b JM Lucas and Associates   (United States)

^c NONE   (United States)

Author keywords

Average run length (ARL); Cumulative sum (CUSUM); FIR feature; Markov chain; Quality control; V mask

Indexed keywords

MARKOV PROCESSES; PROBABILITY DISTRIBUTIONS; QUALITY CONTROL;

AVERAGE RUN LENGTH (ARL); CUMULATIVE SUM (CUSUM) QUALITY CONTROL METHOD; FAST INITIAL RESPONSE (FIR);

STATISTICAL PROCESS CONTROL;

EID: 0033882891     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.2000.10485987     Document Type: Article

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