Forty years of technometrics: Past, present, and future

Technometrics

Volumn 42, Issue 1, 2000, Pages 2-4

  Kafadar, Karen ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ENGINEERING RESEARCH; PROBLEM SOLVING;

DIAGNOSTIC REGRESSION ANALYSIS;

REGRESSION ANALYSIS;

EID: 0033882748     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.2000.10485972     Document Type: Article

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