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Volumn 42, Issue 3, 2000, Pages 277-281

Characterization of multicomponent scales by electron back scattered diffraction (EBSD)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON ABSORPTION; ELECTRON SCATTERING; METALLOGRAPHIC MICROSTRUCTURE; OXIDATION; SCANNING ELECTRON MICROSCOPY;

EID: 0033881768     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(99)00341-3     Document Type: Article
Times cited : (58)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.